Download e-book for kindle: Applications of Finite Element Methods for Reliability by Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou

By Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou

Applications of Finite aspect tools for Reliability reports on ULSI Interconnections offers a close description of the appliance of finite aspect equipment (FEMs) to the learn of ULSI interconnect reliability. during the last twenty years the applying of FEMs has turn into frequent and maintains to steer to a more robust figuring out of reliability physics.

To aid readers focus on the expanding sophistication of FEMs’ purposes to interconnect reliability, Applications of Finite point tools for Reliability stories on ULSI Interconnections will:

  • introduce the primary of FEMs;
  • review numerical modeling of ULSI interconnect reliability;
  • describe the actual mechanism of ULSI interconnect reliability encountered within the electronics undefined; and
  • discuss intimately using FEMs to appreciate and enhance ULSI interconnect reliability from either the actual and sensible standpoint, incorporating the Monte Carlo method.

A full-scale overview of the numerical modeling method utilized in the examine of interconnect reliability highlights helpful and remarkable innovations which have been built lately. Many illustrations are used through the booklet to enhance the reader’s knowing of the technique and its verification. genuine experimental effects and micrographs on ULSI interconnects also are included.

Applications of Finite aspect equipment for Reliability reports on ULSI Interconnections is an effective reference for researchers who're engaged on interconnect reliability modeling, in addition to if you need to know extra approximately FEMs for reliability functions. It offers readers a radical realizing of the functions of FEM to reliability modeling and an appreciation of the strengths and weaknesses of varied numerical types for interconnect reliability.

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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Springer Series in Reliability Engineering) by Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou


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